Semiconductor Laser Engineering, Reliability and Diagnostics

Name: Semiconductor Laser Engineering, Reliability and Diagnostics
Author: Peter W. (Pwe-PhotonicsElectronics-IssueResolution Epperlein

Peter W. (Pwe-PhotonicsElectronics-IssueResolution Epperlein, Germany) University of Stuttgart

John Wiley & Sons Inc

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This reference book provides a fully integrated novel approach to the development of high-power, single-transverse mode, edge-emitting diode lasers by addressing the complementary topics of device engineering, reliability engineering and device diagnostics in the same book, and thus closes the gap in the current book literature.

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